Heterosis Is Prevalent for Multiple Traits in Diverse Maize Germplasm

Overview of attention for article published in PLOS ONE, October 2009

Altmetric Badge

Mentioned by

patent: 1 patent

Citations

dimensions_citation: 153 Dimensions

Readers on

mendeley: 269 Mendeley

Summary Patents Dimensions citations

So far, Altmetric has seen 1 patent that references this research output.

Using oligonucleotide microarrays to analyze genomic differences for the prediction of…

Grant US-8996318-B2

United States of America