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The Intrinsic Resolution Limit in the Atomic Force Microscope: Implications for Heights of Nano-Scale Features

Overview of attention for article published in PLOS ONE, August 2011
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Title
The Intrinsic Resolution Limit in the Atomic Force Microscope: Implications for Heights of Nano-Scale Features
Published in
PLOS ONE, August 2011
DOI 10.1371/journal.pone.0023821
Pubmed ID
Authors

Sergio Santos, Victor Barcons, Hugo K. Christenson, Josep Font, Neil H. Thomson

Abstract

Accurate mechanical characterization by the atomic force microscope at the highest spatial resolution requires that topography is deconvoluted from indentation. The measured height of nanoscale features in the atomic force microscope (AFM) is almost always smaller than the true value, which is often explained away as sample deformation, the formation of salt deposits and/or dehydration. We show that the real height of nano-objects cannot be obtained directly: a result arising as a consequence of the local probe-sample geometry.

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Mendeley readers

The data shown below were compiled from readership statistics for 108 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
United Kingdom 1 <1%
Spain 1 <1%
Switzerland 1 <1%
Unknown 105 97%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 28 26%
Researcher 17 16%
Student > Master 15 14%
Student > Doctoral Student 9 8%
Student > Bachelor 8 7%
Other 14 13%
Unknown 17 16%
Readers by discipline Count As %
Physics and Astronomy 20 19%
Chemistry 16 15%
Materials Science 13 12%
Engineering 12 11%
Biochemistry, Genetics and Molecular Biology 9 8%
Other 20 19%
Unknown 18 17%